Epitaxial growth and dielectric properties of Pb₀.₄Sr₀.₆TiO₃ thin films on (00l)-oriented metallic Li₀.₃Ni₀.₇O₂ coated MgO substrates

摘要

Highly (00l)-oriented Li₀.₃Ni₀.₇O₂thin films have been fabricated on (001) MgO substrates by pulsed laser deposition. The Pb₀.₄Sr₀.₆TiO₃ (PST40) thin film deposited subsequently also shows a significant (00l)-oriented texture. Both the PST40 and Li₀.₃Ni₀.₇O₂have good epitaxial behavior. The epitaxial growth of the PST40 thin film is more perfect with the Li₀.₃Ni₀.₇O₂buffer layer due to the less distortion in the film. The dielectric tunability of the PST40 thin film with Li₀.₃Ni₀.₇O₂buffer layer therefore reaches 70%, which is 75% higher than that without Li₀.₃Ni₀.₇O₂buffer layer, and the dielectric loss of the PST40 thin film is 0.06.